Surface visual inspection and analyses are regarded as a valuable mean in experimental research and have played a great role in technology development in the last century.

In order to overcome the shortcomings of the optical microscope, due to the limitation in size visualization caused by light wavelength limit and diffraction, the Electron microscope was developed. Electron microscopes, in turn, had their own weakness when it comes to imaging in the non-vacuum environment and imaging with no prior modifications performed on the samples.

In the last decade of the 20th century, Atomic Force Microscopes were developed and a new milestone was created in Nano visualization and analyses of material surfaces.

Any sample type bio, metal, non-metal, polymers, etc. may be scanned by AFM in various environments; air, liquid, vacuum and non-air gas under different physical conditions; temperature, pressure, electrical and magnetic field, etc.

Central Laboratory-College of science-University of Tehran

Device type: Multi-Model AFM

Model: Full Plus

Lab manager: Dr Mehran Habibi-Rezaei

Operator: Roshheh Eshraghi - Safura Nedamani

§  Imaging and characterization of samples using AFM non-contact, tapping and contact mode

§  Providing Microscopic images with zoom and high resolution at the Nanoscale

§  Determine the level of Roughness, determine the shape, estimates the size of produced nanostructures

§  Study of Surface morphology

Tell: 02161113214 - 09195387521

Email:Roshheh.eshraghi@gmail.com & s.nedamani@gmail.com